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Date: 2010
Language: eng
Resource Type: conference paper
Identifier: http://hdl.handle.net/1959.14/117903
Description: Correct measurement of low frequency noise in a transistor requires prior knowledge of its s-parameters but the measurement of s-parameters at very low frequencies are difficult due to long time const ... More
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Reviewed: Reviewed
Date: 2006
Language: eng
Resource Type: conference paper
Identifier: http://hdl.handle.net/1959.14/107304
Description: A novel view of dispersion of linearity in broadband circuits is offered, whereby memory effects impart a frequency dependence to linearity of FET amplifiers. The considerable variation in intermodula ... More
Reviewed: Reviewed
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