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| Title | Author/Creator | Date | Full Text | Reviewed | |
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| Characterising microwave transistor dynamics with small-signal measurements | Parker, Anthony E; Rathmell, James G | 2006 | — | 
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| Modelling electron trapping effects on gate lag in field effect devices | Zaman, Saif Uz; Parker, Anthony E | 2006 | — |
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| Nonlinear network analysis and measurement | Blockley, Peter S; Scott, Jonathan B; Gunyan, Daniel; Parker, Anthony E | 2006 | — |
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| Symmetric HEMT drain current model for intermodulation distortion prediction | Brinkhoff, James; Parker, Anthony E; Mahon, Simon J; McCulloch, Gerry | 2006 | — |
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Author/Creator
- Blockley, Peter S (1)
- Brinkhoff, James (1)
- Gunyan, Daniel (1)
- Mahon, Simon J (1)
- McCulloch, Gerry (1)
- Rathmell, James G (1)
- Scott, Jonathan B (1)
- Zaman, Saif Uz (1)
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