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| Title | Author/Creator | Date | Full Text | Reviewed | |
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| Bias and frequency dependence of FET characteristics | Parker, Anthony Edward; Rathmell, James Grantley | 2003 | 
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| Measurement and characterization of HEMT dynamics | Parker, Anthony E; Rathmell, James Grantley | 2001 |
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Author/Creator
Subject Keyword
- HEMTs (1)
- MESFETs (1)
- MODFETs (1)
- charge carrier processes (1)
- high-speed devices (1)
- kink effect (1)
- microwave devices (1)
- pulse measurements (1)
- pulsed characterization (1)
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