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Title Author/Creator Date Full Text Reviewed
Add Measurement and characterization of HEMT dynamics Parker, Anthony E; Rathmell, James Grantley 2001 Full Text Reviewed
Add Bias and frequency dependence of FET characteristics Parker, Anthony Edward; Rathmell, James Grantley 2003 Full Text Reviewed
Add Broad-band characterization of FET self-heating Parker, Anthony Edward; Rathmell, James Grantley 2005 Full Text Reviewed
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  • Parker, Anthony Edward (2)
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  • impact ionization (2)
  • HEMTs (1)
  • MESFETs (1)
  • MODFETs (1)
  • charge carrier processes (1)
  • high-speed devices (1)
  • intermodulation (1)
  • kink effect (1)
  • memory effect (1)
  • microwave devices (1)
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Rathmell, James Grantley

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