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| Title | Author/Creator | Date | Full Text | Reviewed | |
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| Characterization of systematic and random diode mismatches in antiparallel-diode mixers | Gutta, Venkata; Parker, Anthony Edward; Fattorini, Anthony | 2009 | 
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| The Random component of mixer-based nonlinear vector network analyzer measurement uncertainty | Blockley, Peter Stuart; Scott, Jonathan Brereton; Gunyan, Daniel; Parker, Anthony Edward | 2007 |
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| Noise considerations when determining phase of large-signal microwave measurements | Blockley, Peter Stuart; Scott, Jonathan Brereton; Gunyan, Daniel; Parker, Anthony Edward | 2006 |
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| Broad-band characterization of FET self-heating | Parker, Anthony Edward; Rathmell, James Grantley | 2005 |
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| Baseband impedance and linearization of FET circuts | Brinkhoff, James; Parker, Anthony Edward; Leung, Martin | 2003 | — |
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| Bias and frequency dependence of FET characteristics | Parker, Anthony Edward; Rathmell, James Grantley | 2003 |
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| Effect of baseband impedance on FET intermodulation | Brinkhoff, James; Parker, Anthony Edward | 2003 |
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Author/Creator
- Blockley, Peter Stuart (2)
- Brinkhoff, James (2)
- Gunyan, Daniel (2)
- Rathmell, James Grantley (2)
- Scott, Jonathan Brereton (2)
- Fattorini, Anthony (1)
- Gutta, Venkata (1)
- Leung, Martin (1)
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