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Corrosion at the surface of chalcogenide glass microspheres |
Kane, D. M; Chater, R. J; Gore, D. B; McPhail, D. S |
2012 |
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Evaluation of imperfections in silica and chalcogenide glass microspheres using focussed ion beam milling and imaging |
Kane, D. M; Chater, R. J; McPhail, D. S |
2012 |
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Focused ion beam sectioning of micro-optics as a tool for destructive testing for optical material |
Kane, D. M; Chater, R. J; McPhail, D. S |
2012 |
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Micro-optical elements and optical materials of certain spider webs |
Kane, D. M; Naidoo, N; Little, D. J |
2012 |
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Image contrast immersion method for measuring refractive index applied to spider silks |
Little, Douglas J; Kane, D. M |
2011 |
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Imperfections in micro-optics characterised using focussed ion beam sectioning and imaging |
Kane, D. M; Chater, R. J; McPhail, D. S |
2011 |
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Measuring the refractive index of spider silks using image-contrast immersion methods |
Little, D. J; Kane, D. M |
2011 |
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Uncertainty in interpulse time interval evaluated as a new measure of nonlinear laser dynamics |
Toomey, J. P; Nichkawde, C; Kane, D. M |
2011 |
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Variable pulse repetition frequency output from an optically injected solid state laser |
Kane, D. M; Toomey, J. P |
2011 |
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Atomic force microscopy of orb-spider-web-silks to measure surface nanostructuring and evaluate silk fibers per strand |
Kane, D. M; Naidoo, N; Staib, G. R |
2010 |
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Enhanced performance of an EUV light source (λ=84nm) using short-pulse excitation of a windowless dielectric barrier discharge in neon |
Carman, R. J; Kane, D. M; Ward, B. K |
2010 |
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Optical surface profilometry and AFM of Orb weaver spider silks |
Kane, D. M; Staib, G. R; Naidoo, N; Joyce, A. M; Rabeau, J. R... More
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2010 |
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Use of instantaneous frequency measurement to determine the injection current range giving valid Relaxation Oscillation Frequency values in quantum well lasers |
McMahon, C. J; Kane, D. M |
2010 |
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Automated correlation dimension analysis of optically injected solid state lasers |
Toomey, J. P; Kane, D. M; Valling, S; Lindberg, A. M |
2009 |
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Precision threshold current measurement for semiconductor lasers based on relaxation oscillation frequency |
Kane, D. M; Toomey, Joshua P |
2009 |
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List View
