Diode mismatch in an antiparallel-diode (APD) mixer results in an unwanted virtual local-oscillator (LO) leakage. At a radio system level, the virtual LO leakage is primarily a challenge of meeting spurious emission requirements. At a device level, it is a challenge of circuit yield, determined by the statistical variation in diode mismatch of a semiconductor fabrication process. This paper introduces methods of characterizing diode mismatch in APD mixers. The parameters of these characterization methods can be used to make an informed selection of the fabrication process, diode size, and LO pump power for reduced virtual LO leakage and improved yield.
Copyright 2009 IEEE. Reprinted from IEEE transactions on microwave theory and techniques, Volume 57, Issue 12, 3153-3162. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Macquarie University’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to email@example.com. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.