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Scanning Kelvin-probe study of the hydrogen-terminated diamond surface in ultrahigh vacuum

Please use this identifier to cite or link to this item: http://hdl.handle.net/1959.14/85134

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Title: Scanning Kelvin-probe study of the hydrogen-terminated diamond surface in ultrahigh vacuum
Related: Applied physics letters, Vol. 95, No. 12, p.123108-1-123108-3
DOI: 10.1063/1.3222864
Publisher: American Institute of Physics
Date: 2009
Author/Creator: Pakes, C. I
Author/Creator: Hoxley, D
Author/Creator: Rabeau, J. R
Author/Creator: Edmonds, M. T
Author/Creator: Kalish, R
Author/Creator: Prawer, S
Description: Atomic-force and Kelvin-probe microscopies were employed in ultrahigh vacuum to image the surface topography and contact potential of the hydrogen-terminated and unterminated surfaces of diamond. A variation of about 25 meV in the contact potential was measured on a length scale of 20 nm and ascribed to differently orientated surface domains resulting from hydrogen-plasma processing of the sample. Shifts in the work function arising from sample heating in vacuum and the adsorption of C₆₀ were measured. The Fermi level was found to be 0.7 and 1.1 eV below the valence band maximum for C₆₀ coverages of 1 and 4 monolayer, respectively.
Description: 3 page(s)
Subject Keyword: adsorption
Subject Keyword: atomic force microscopy
Subject Keyword: valence bands
Subject Keyword: work function
Subject Keyword: contact potential
Subject Keyword: diamond
Subject Keyword: Fermi level
Subject Keyword: fullerenes
Subject Keyword: hydrogen
Subject Keyword: plasma materials processing
Subject Keyword: scanning probe microscopy
Subject Keyword: surface topography
Resource Type: journal article
Organisation: Macquarie University. Dept. of Physics and Engineering

Identifier: http://hdl.handle.net/1959.14/85134
Identifier: ISSN:1077-3118
Identifier: mq-rm-2009005387
Language: eng
Rights: Copyright 2009 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied physics letters, Vol. 95, Issue 12, pp.123108-1 - 123108-3, and may be found at http://apl.aip.org/applab/v95/i12/p123108_s1
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