Optical surface profilometry and AFM of Orb weaver spider silks | Macquarie University ResearchOnline

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Title: Optical surface profilometry and AFM of Orb weaver spider silks
Related: International Conference on Nanoscience and Nanotechnology (3rd : 2010) (22 - 26 February 2010 : Sydney)
Related: Dzurak, Andrew. ICONN 2010 : proceedings of the 2010 International Conference on Nanoscience and Nanotechnology, p.222-224
DOI: 10.1109/ICONN.2010.6045264
Publisher: IEEE
Date: 2010
FoR/RFCD Code(s): 060800 Zoology 060000 Biological Sciences
Author/Creator: Kane, D. M
Author/Creator: Staib, G. R
Author/Creator: Naidoo, N
Author/Creator: Joyce, A. M
Author/Creator: Rabeau, J. R
Author/Creator: Herberstein, M. E
Description: AFM (Atomic Force Microscopy) and OSP (Optical Surface Profiling) have been applied to measure the surfaces of spider silks – both radials and capture silks- at the nano- and micro-scale.
Description: 3 page(s)
Subject Keyword: 060800 Zoology
Subject Keyword: 060000 Biological Sciences
Subject Keyword: spider silk
Subject Keyword: AFM
Subject Keyword: optical surface profile
Subject Keyword: surface topology
Subject Keyword: nanoscale roughness
Subject Keyword: microscale topology
Resource Type: conference paper
Organisation: Macquarie University. Dept. of Electronic Engineering
Organisation: Macquarie University. Dept. of Physics and Astronomy
Organisation: Macquarie University. Dept. of Biological Sciences

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