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Characterisation of fs-laser written refractive index changes using near-field scanning optical microscopy

Please use this identifier to cite or link to this item: http://hdl.handle.net/1959.14/147638

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Title: Characterisation of fs-laser written refractive index changes using near-field scanning optical microscopy
Related: Photonics : Design, Technology, and Packaging III (5 December 2007 : Canberra)
Related: Krolikowski, Wieslaw Z.; Soukoulis, Costas M.; Lam, Ping Koy; Davis, Timothy J.; Fan, Shanhui and Kivshar, Yuri S.. Proceedings of SPIE - The International Society for Optical Engineering, p.680119-1-680119-9
DOI: 10.1117/12.761087
Related: SPIE proceedings series Vol. 6801
Publisher: Bellingham, US : Society of Photo-optical Instrumentation Engineers (SPIE)
Date: 2008
FoR/RFCD Code(s): 020500 Optical Physics
Author/Creator: Little, D
Author/Creator: Dekker, P
Author/Creator: Dawes, J
Author/Creator: Rahmani, A
Author/Creator: Marshall, G
Description: We have performed measurements using a purpose-built Near-field Scanning Optical Microscope and shown that waveguides written with a fs laser in the kHz regime have an asymmetry associated with the unidirectional nature of the writing beam. Further, the asymmetry becomes more pronounced with increasing pulse energy. At very high pulse energies (5-10 J) the presence of multiple guided regions was also observed, indicating that the refractive index profile of the waveguide possesses several maxima, a result which is consistent with current studies on the filamentation process that high-powered laser pulses experience in a dielectric medium. In this paper we will present these observations, their subsequent analysis and implications for photonic device fabrication using this method.
Description: 9 page(s)
Subject Keyword: 020500 Optical Physics
Resource Type: conference paper
Organisation: Macquarie University. Dept. of Physics

Identifier: http://hdl.handle.net/1959.14/147638
Identifier: ISBN:9780819469724
Identifier: ISSN:0277-786X
Identifier: mq-rm-2008990174
Language: eng
Rights: Copyright 2008 Society of Photo Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.
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