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Impact of the pulse-amplifier slew-rate on the pulsed-IV measurement of GaN HEMTs

Please use this identifier to cite or link to this item: http://hdl.handle.net/1959.14/119542

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Title: Impact of the pulse-amplifier slew-rate on the pulsed-IV measurement of GaN HEMTs
Related: ARFTG Conference (75th : 2010) (May 28 2010 : Anaheim, Calif.)
Related: 75th ARFTG Microwave Measurement Conference : measurement of modulated signals for communications : May 28,2010, the Hilton Anaheim, Anaheim, California, p.1-7
DOI: 10.1109/ARFTG.2010.5496336
Publisher: Piscataway, N.J : IEEE Computer Society
Date: 2010
FoR/RFCD Code(s): 100600 Computer Hardware
Author/Creator: Albahrani, Sayed Ali
Author/Creator: Parker, Anthony Edward
Description: The influence of the non-ideal response of the pulse-amplifier on the trap and self-heating dynamics, and hence, on the drain-current transient in a GaN HEMT is studied with new trap and self-heating models. It is shown that the study of the trap and self-heating dynamics requires a proper correction technique that accounts for the change in trap-potential, trap time-constant and thermal response due to the non-ideal response of the pulse-amplifier. Several post-measurement data correction techniques are discussed and shown to be incapable of predicting the true drain-current transient. A pre-measurement terminal correction technique using a new version of the pulse measurement system is used to solve the problem.
Description: 7 page(s)
Subject Keyword: 100600 Computer Hardware
Subject Keyword: HEMT
Subject Keyword: pulse measurement
Subject Keyword: pulse amplifier slew rate
Subject Keyword: self-heating
Subject Keyword: trap
Resource Type: conference paper
Organisation: Macquarie University. Dept. of Electronic Engineering

Identifier: http://hdl.handle.net/1959.14/119542
Identifier: ISBN:9781424463640
Identifier: mq-rm-2009011597
Language: eng
Rights: Copyright 2010 IEEE. Reprinted from 75th ARFTG Microwave Measurement Conference : measurement of modulated signals for communications : May 28,2010, the Hilton Anaheim, Anaheim, California. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Macquarie University’s products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.
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