Please use this identifier to cite or link to this item: http://hdl.handle.net/1959.14/116888
43 Visitors
45 Hits
0 Downloads
- Title
- Fault tolerance with noisy and slow measurements and preparation
- Related
- Physical review letters, Vol. 105, Issue 10 (2010), p.100501-1-100501-4
- DOI
- 10.1103/PhysRevLett.105.100501
- Publisher
- American Physical Society
- Date
- 2010
- FoR/RFCD Code(s)
-
020000 Physical Sciences
010000 Mathematical Sciences
090000 Engineering
- Author/Creator
- Paz-Silva, Gerardo A
- Author/Creator
- Brennen, Gavin K
- Author/Creator
- Twamley, Jason
- Description
- It is not so well known that measurement-free quantum error correction protocols can be designed to achieve fault-tolerant quantum computing. Despite their potential advantages in terms of the relaxation of accuracy, speed, and addressing requirements, they have usually been overlooked since they are expected to yield a very bad threshold. We show that this is not the case. We design fault-tolerant circuits for the 9-qubit Bacon-Shor code and find an error threshold for unitary gates and preparation of p(p,g)thresh=3.76×10⁻⁵ (30% of the best known result for the same code using measurement) while admitting up to 1/3 error rates for measurements and allocating no constraints on measurement speed. We further show that demanding gate error rates sufficiently below the threshold pushes the preparation threshold up to p(p)thresh=1/3.
- Description
- 4 page(s)
- Subject Keyword
- 020000 Physical Sciences
- Subject Keyword
- 010000 Mathematical Sciences
- Subject Keyword
- 090000 Engineering
- Resource Type
- journal article
- Organisation
- Macquarie University. Dept. of Physics and Astronomy
- Identifier
- http://hdl.handle.net/1959.14/116888
- Identifier
- ISSN:0031-9007
- Identifier
- mq-rm-2010003405
- Language
- eng
- Rights
- Gerardo A. Paz-Silva, Gavin K. Brennen, and Jason Twamley, Phys. Rev. Lett. 105, 100501 (2010) [4 pages]. Copyright (2010) by the American Physical Society. The original article can be found at http://link.aps.org/doi/10.1103/PhysRevLett.105.100501.
- Full Text
- Reviewed
-
-
