Atomic force microscopy of orb-spider-web-silks to measure surface nanostructuring and evaluate silk fibers per strand | Macquarie University ResearchOnline

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Atomic force microscopy of orb-spider-web-silks to measure surface nanostructuring and evaluate silk fibers per strand

Please use this identifier to cite or link to this item: http://hdl.handle.net/1959.14/115357

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Title: Atomic force microscopy of orb-spider-web-silks to measure surface nanostructuring and evaluate silk fibers per strand
Related: Journal of applied physics, Vol. 108, Issue 7 (2010), p.73509-1-73509-5
DOI: 10.1063/1.3490220
Publisher: American Institute of Physics
Date: 2010
FoR/RFCD Code(s): 020000 Physical Sciences 010000 Mathematical Sciences 090000 Engineering
Author/Creator: Kane, D. M
Author/Creator: Naidoo, N
Author/Creator: Staib, G. R
Description: Atomic force microscopy (AFM) study is used to measure the surface topology and roughness of radial and capture spider silks on the micro- and nanoscale. This is done for silks of the orb weaver spider Argiope keyserlingi. Capture silk has a surface roughness that is five times less than that for radial silk. The capture silk has an equivalent flatness of λ/100 (5–6 nm deep surface features) as an optical surface. This is equivalent to a very highly polished optical surface. AFM does show the number of silk fibers that make up a silk thread but geometric distortion occurs during sample preparation. This prevented AFM from accurately measuring the silk topology on the microscale in this study.
Description: 5 page(s)
Subject Keyword: 020000 Physical Sciences
Subject Keyword: 010000 Mathematical Sciences
Subject Keyword: 090000 Engineering
Subject Keyword: atomic force microscopy
Subject Keyword: nanostructured materials
Subject Keyword: natural fibres
Subject Keyword: polishing
Subject Keyword: surface morphology
Subject Keyword: surface roughness
Resource Type: journal article
Organisation: Macquarie University. Dept. of Physics and Astronomy

Identifier: http://hdl.handle.net/1959.14/115357
Identifier: ISSN:1089-7550
Identifier: mq-rm-2010003538
Language: eng
Rights: Copyright (2010) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in J. Appl. Phys. 108, 073509 (2010)and may be found at http://link.aip.org/link/doi/10.1063/1.3490220.
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