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Dispersion of linearity in broadband FET circuits

Please use this identifier to cite or link to this item: http://hdl.handle.net/1959.14/107304

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Title: Dispersion of linearity in broadband FET circuits
Related: European Microwave Integrated Circuits Conference (1st : 2006) (10 - 13 September 2006 : Manchester, UK)
Related: Marsh, Steve. Proceedings of the 1st European Microwave Integrated Circuits Conference, p.320-323
DOI: 10.1109/EMICC.2006.282817
Publisher: London : Horizon House Publications
Date: 2006
FoR/RFCD Code(s): 090600 Electrical and Electronic Engineering
Author/Creator: Parker, Anthony E
Author/Creator: Rathmell, James G
Description: A novel view of dispersion of linearity in broadband circuits is offered, whereby memory effects impart a frequency dependence to linearity of FET amplifiers. The considerable variation in intermodulation across wide bandwidths due to trapping and heating mechanisms are considered here as a dispersion of linearity that is bias dependent. This is of interest to designers because the dispersion gives intermodulation a strong dependence on center and spacing of test frequencies, which requires an interpretation of intermodulation measurements and specifications across the whole signal bandwidth. This is important for meeting legislative requirements or for designing for good spurious-free dynamic range, and for improving the performance of linearization techniques where band-limiting of optimal linear conditions may occur.
Description: 4 page(s)
Subject Keyword: 090600 Electrical and Electronic Engineering
Subject Keyword: charge trapping
Subject Keyword: impact ionization
Subject Keyword: intermodulation
Subject Keyword: kink effect
Subject Keyword: memory effect
Subject Keyword: microwave FET
Subject Keyword: self heating
Subject Keyword: transistor modeling
Resource Type: conference paper
Organisation: Macquarie University. Dept. of Electronics

Identifier: http://hdl.handle.net/1959.14/107304
Identifier: ISBN:9782960055184
Identifier: mq-rm-2006004753
Language: eng
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